The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Nov. 17, 2017
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Dae Wook Kim, Tucson, AZ (US);
Isaac Trumper, Tucson, AZ (US);
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Abstract
Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.