The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Nov. 11, 2019
Precitec Optronik Gmbh, Neu-Isenburg, DE;
Martin Schönleber, Neu-Isenburg, DE;
PRECITEC OPTRONIK GMBH, Neuisenburg, DE;
Abstract
A chromatic confocal measuring device for the measurement of distances and/or thicknesses of several locations has a light source that emits polychromatic measuring light through a light exit surface. The light source is a laser pumped luminophore-based light source and has an oblong exit surface. The measuring device further has at least one first confocal aperture through which the measuring light passes and which comprises a plurality of punctiform orifices or at least one slit-shaped orifice. The measuring device also includes imaging optics configured to cause a chromatic focus shift of the measuring light and to image the first confocal aperture in a measurement volume so that different wavelengths are focused at different heights. A first receiving and evaluating unit measures the intensity of the measuring light reflected by the measurement object as a function of the wavelength and of the transverse position of the reflection location on the measurement object and determines therefrom distances and/or thicknesses of several locations or of a region of the measurement object extending in at least one spatial direction.