The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Aug. 22, 2017
Applicant:

Silcotek Corp., Bellefonte, PA (US);

Inventors:

David A. Smith, Bellefonte, PA (US);

James B. Mattzela, Port Matilda, PA (US);

Paul H. Silvis, Port Matilda, PA (US);

Gary A. Barone, State College, PA (US);

Assignee:

SILCOTEK CORP., Bellefonte, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/32 (2006.01); C23C 16/56 (2006.01); C23C 8/10 (2006.01); B05D 1/00 (2006.01);
U.S. Cl.
CPC ...
C23C 16/325 (2013.01); C23C 8/10 (2013.01); C23C 16/56 (2013.01); B05D 1/60 (2013.01); B05D 2202/15 (2013.01); Y10T 428/24802 (2015.01);
Abstract

The present invention relates to a coated article. The coated article includes a first layer, a second layer, and a diffusion region between the first layer and the second layer. The first layer has a first atomic concentration of C, a first atomic concentration of Si, and a first atomic concentration of O. The second layer has a first atomic concentration of Fe, a first atomic concentration of Cr, and a first atomic concentration of Ni. The diffusion region has a second atomic concentration of the C, a second atomic concentration of the Si, a second atomic concentration of the O, a second atomic concentration of the Fe, a second atomic concentration of the Cr, and a second atomic concentration of the Ni. All of the atomic concentrations are based upon Auger Electron Spectroscopy.


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