The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Jul. 24, 2015
Applicant:

Gatan, Inc., Pleasanton, CA (US);

Inventors:

John Andrew Hunt, Fremont, CA (US);

Steven Thomas Coyle, Alameda, CA (US);

Michael Patrick Hassel-Shearer, Little Haseley, GB;

Thijs C Hosman, San Francisco, CA (US);

Assignee:

Gatan, Inc., Pleasonton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01); C23C 14/46 (2006.01); C23C 14/54 (2006.01); C23C 14/50 (2006.01); C23C 14/56 (2006.01); C23C 14/02 (2006.01); H01J 37/317 (2006.01); H01J 37/305 (2006.01);
U.S. Cl.
CPC ...
C23C 14/46 (2013.01); C23C 14/022 (2013.01); C23C 14/50 (2013.01); C23C 14/505 (2013.01); C23C 14/545 (2013.01); C23C 14/566 (2013.01); H01J 37/3053 (2013.01); H01J 37/3178 (2013.01); H01J 2237/0822 (2013.01); H01J 2237/184 (2013.01); H01J 2237/202 (2013.01); H01J 2237/204 (2013.01); H01J 2237/3146 (2013.01); H01J 2237/3151 (2013.01);
Abstract

Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.


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