The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Oct. 02, 2015
Varian Medical Systems International Ag, Cham, CH;
Matthias Oster, Palo Alto, CA (US);
Andres Graf, Oberwil, CH;
Abstract
A method for quantifying radiation beam conformity includes: obtaining first information regarding a prescribed aperture; obtaining second information regarding an actual aperture defined by components of a collimator; and determining, using a processing unit, a metric based on the first information regarding the prescribed aperture and the second information regarding the actual aperture, wherein the metric indicates an amount of over-exposed aperture area, an amount of under-exposed aperture area, or both, and wherein the processing unit comprises one or more input for receiving the first and second information, and comprises a metric determination module configured to determine the metric based on the first information and the second information.