The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 29, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Vijay Thakur Shamdasani, Eindhoven, NL;
Yin Hui Deng, Eindhoven, NL;
Ying Wu, Eindhoven, NL;
Hua Xie, Cambridge, MA (US);
Shiwei Zhou, Acton, MA (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention proposes an ultrasound imaging system and method for measuring a property of a region of interest in a subject by using shear wave, wherein an ultrasound probe is configured to sequentially transmit, to each of a plurality of focal spots () in the region of interest, a push pulse () for generating a shear wave (), each of the plurality of focal spots having a mutually different depth value (z, z, z), and to receive ultrasound echo signals adjacent () to each of the plurality of focal spots; a shear wave detector is configured to derive, for each of the plurality of focal spots, a first parameter indicating a property of the generated shear wave, based on the received ultrasound echo signals; and a property estimator is configured to estimate a second parameter indicating the property of the region of interest as a function of the derived first parameters.