The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 20, 2016
Applicants:
Rensselaer Polytechnic Institute, Troy, NY (US);
University of Central Florida, Orlando, FL (US);
Inventors:
Ge Wang, Loudonville, NY (US);
Wenxiang Cong, Albany, NY (US);
Zaifeng Shi, Tianjin, CN;
Shuo Pang, Oviedo, FL (US);
Assignees:
Rensselaer Polutechnic Institute, Troy, NY (US);
University of Central Florida, Orlando, FL (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/032 (2013.01);
Abstract
Novel and advantageous systems and methods for performing X-ray imaging by extracting X-ray phase-shift and/or dark-field information through a detector that has built-in G2 functionality are provided. Grating translation can be replaced by an electrical operation in the detection procedure, thereby eliminating the need for the analyzer grating and the typical mechanical stepping process.