The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Oct. 25, 2016
Applicants:

Surgiqual Institute, La Tronche, FR;

Université Grenoble Alpes, Saint Martin d'Hères, FR;

Centre Hospitalier Universitaire DE Grenoble, La Tronche, FR;

Inventors:

Yannick Grondin, Arbin, FR;

Philippe Augerat, St Ismier, FR;

Philippe Cinquin, St Nazaire les Eymes, FR;

Laurent Desbat, La Tronche, FR;

Marion Decrouez, Chambery, FR;

Assignees:

SURGIQUAL INSTITUTE, Meylan, FR;

UNIVERSITÉ GRENOBLE ALPES, Saint Martin d'Heres, FR;

CENTRE HOSPITALIER UNIVERSITAIRE DE GRENOBLE, La Tronche, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/06 (2006.01); A61B 6/12 (2006.01); A61B 6/00 (2006.01); G01T 1/164 (2006.01); G01T 7/00 (2006.01); A61B 34/20 (2016.01); G21K 1/04 (2006.01); A61B 6/03 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 6/12 (2013.01); A61B 6/03 (2013.01); A61B 6/06 (2013.01); A61B 6/4266 (2013.01); A61B 6/4441 (2013.01); A61B 6/5205 (2013.01); A61B 6/547 (2013.01); A61B 6/585 (2013.01); A61B 34/20 (2016.02); G01T 1/1648 (2013.01); G01T 7/00 (2013.01); G21K 1/043 (2013.01); A61B 6/4085 (2013.01); A61B 6/4405 (2013.01); A61B 2090/3764 (2016.02);
Abstract

The invention relates to an X-ray imaging device including a rotary collimator having a region () which is opaque to X-rays, a first slot () and a second slot (), which are transparent to X-rays and extend in two different directions, passing through the opaque region, the collimator making it possible to determine the position of an element provided with X-ray sensors in an imaging system (FIG.).


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