The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Feb. 08, 2018
Applicants:

Lightlab Sweden Ab, Uppsala, SE;

Nanyang Technological University, Singapore, SG;

Inventors:

Jonas Tirén, Uppsala, SE;

Hilmi Volkan Demir, Singapore, SG;

Vijay Kumar Sharma, Singapore, SG;

Swee Tiam Tan, Singapore, SG;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 41/392 (2006.01); H01J 63/02 (2006.01); G01R 31/44 (2020.01);
U.S. Cl.
CPC ...
H05B 41/3922 (2013.01); G01R 31/44 (2013.01); H01J 63/02 (2013.01);
Abstract

The present invention generally relates to a method for operating a plurality of field emission light sources, specifically for performing a testing procedure in relation to a plurality of field emission light sources manufactured in a chip based fashion. The invention also relates to a corresponding testing system.


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Tirén, Jonas. (2020). Chip testing method and an apparatus for testing of a plurality of field emission light sources (U.S. Patent No. 10728966). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10728966

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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