The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Dec. 17, 2015
Applicant:

Intel Ip Corporation, Santa Clara, CA (US);

Inventors:

Yuanyuan Wang, Beijing, CN;

Yucheng Dai, Beijing, CN;

Ralf Rossbach, Neubiberg, DE;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/309 (2015.01); H04W 36/00 (2009.01); H04W 48/16 (2009.01); H04W 76/27 (2018.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/309 (2015.01); H04W 36/00837 (2018.08); H04W 48/16 (2013.01); H04W 76/27 (2018.02);
Abstract

A radio communication device includes a transceiver and a cell measurement reporting circuit configured to determine for a signal reception quality related event, whether an event entry condition is fulfilled, in case the condition is fulfilled concerning a cell for the event, to add the concerned cell into a candidate reporting list, to trigger and carry out a first measurement report process for the cell included in the candidate reporting list, after having carried out the first measurement report process, to determine, for each cell included in the candidate reporting list and for which no first measurement report process has been carried out, as to whether a measurement criterion for the respective cell is fulfilled with respect to a cell for which the first measurement report process has been carried out, and to trigger and carry out a second measurement report process for each cell which fulfills the measurement criterion.


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