The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Dec. 17, 2014
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Danial Muhammad Ranjha, Spokane, WA (US);

Jon Arron McClintock, Seattle, WA (US);

Tushaar Sethi, Seattle, WA (US);

Maarten Van Horenbeeck, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 29/06 (2006.01); G06F 21/62 (2013.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 16/9024 (2019.01); G06F 21/6218 (2013.01);
Abstract

A method and apparatus for risk scoring in a graph are disclosed. In the method and apparatus, a graph includes a first node that is connected with a node of a plurality of nodes using a communication link of a plurality of communication links. A plurality of link risk measures are then determined, whereby a link risk measure of the plurality of link risk measures pertains to the communication link of the plurality of communication links. Furthermore, a risk measure associated with the first node is determined based at least in part on the plurality of link risk measures. The risk measure is monitored to determine if one or more conditions placed on the risk measure are met and one or more actions are taken as a result of the one or more conditions being met.


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