The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Dec. 08, 2016
Applicant:

Samsung Electronics Co., Ltd, Gyeonggi-do, KR;

Inventors:

Jongbu Lim, Seoul, KR;

Jiyun Seol, Gyeonggi-do, KR;

Byunghwan Lee, Gyeonggi-do, KR;

Chaehee Lim, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04W 72/04 (2009.01); H04W 72/08 (2009.01); H04B 7/024 (2017.01);
U.S. Cl.
CPC ...
H04L 5/0032 (2013.01); H04B 7/024 (2013.01); H04L 5/0023 (2013.01); H04L 5/0044 (2013.01); H04L 5/0073 (2013.01); H04W 72/0453 (2013.01); H04W 72/082 (2013.01); H04L 5/0091 (2013.01); H04W 72/046 (2013.01);
Abstract

The present disclosure relates to a pre-5-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4-Generation (4G) communication system such as Long Term Evolution (LTE). An operating method for controlling interference between base stations in a wireless communication system includes determining at least one or more beam indexes of a first base station, receiving resource information of a second base station from the second base station, determining a frequency resource of the first base station, based on the at least one or more beam indexes of the first base station and the resource information of the second base station, and communicating with a user equipment, using information about the determined frequency resource of the first base station.


Find Patent Forward Citations

Loading…