The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Mar. 11, 2019
Applicant:
Luna Innovations Incorporated, Roanoke, VA (US);
Inventors:
Todd Christian Haber, Jonhs Creek, GA (US);
Justin Stay, Atlanta, GA (US);
Joel Leslie Mock, Peachtree Corners, GA (US);
Daniele Costantini, St. Prex, CH;
Assignee:
Luna Innovations Incorporated, Roanoke, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/3127 (2013.01);
Abstract
Systems, methods, and structures for overcoming Rayleigh backscatter in wavelength division multiplexed fiber optic systems and in particular fiber optic sensor systems along with method(s) for detecting faults in optical networks employing the intentional temporal separation of share wavelength noise and demarcation signals in conjunction with the use of accumulated Rayleigh noise signal(s) to detect a fault location.