The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Nov. 08, 2018
Applicant:

Shenzhen Super Data Link Technology Ltd., Shenzhen, CN;

Inventors:

Ruopeng Liu, Shenzhen, CN;

Chunlin Ji, Shenzhen, CN;

Jing Nie, Shenzhen, CN;

YanQing Tan, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/00 (2006.01); H01Q 15/14 (2006.01); H01Q 15/00 (2006.01); H03H 11/02 (2006.01);
U.S. Cl.
CPC ...
H03K 5/00 (2013.01); H01Q 15/00 (2013.01); H01Q 15/14 (2013.01); H03H 11/02 (2013.01); H03K 2005/00286 (2013.01);
Abstract

A metamaterial comprises a plurality of electrically controllable metamaterial units each comprising a varactor diode; the predetermined angle is an angle at which an electromagnetic wave is reflected from a surface of the metamaterial; there is an association relationship between the predetermined angle and the first phase difference; the method comprises: determining a first phase difference between electromagnetic waves reflected by two adjacent electrically controllable metamaterial units in a metamaterial based on a predetermined angle; determining a target capacitance of the varactor diode in each electrically controllable metamaterial unit based on the first phase difference; and adjusting a capacitance of the varactor diode in each electrically controllable metamaterial unit to the target capacitance.


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