The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Jun. 19, 2019
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Jeronimo Segovia Fernandez, San Jose, CA (US);
Peter Smeys, San Jose, CA (US);
Ali Djabbari, Saratoga, CA (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03J 7/04 (2006.01); H03B 5/06 (2006.01);
U.S. Cl.
CPC ...
H03J 7/04 (2013.01); H03B 5/06 (2013.01); B81B 2201/0271 (2013.01);
Abstract
Methods, apparatus, systems and articles of manufacture are disclosed to measure a resonant sensor based on detection of group delay. An example apparatus includes a modulation manager configured to query the resonant sensor with a modulated signal including a frequency; and a resonance determiner configured to determine a resonance frequency of the resonant sensor based on a group delay associated with the resonant sensor and the frequency.