The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Jan. 12, 2018
Applicant:

Magnachip Semiconductor, Ltd., Cheongju-si, KR;

Inventors:

Guk Hwan Kim, Cheongju-si, KR;

Jin Yeong Son, Cheongju-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/08 (2006.01); H01L 21/225 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01); H01L 21/311 (2006.01); H01L 27/088 (2006.01); H01L 29/66 (2006.01); H01L 21/8234 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0852 (2013.01); H01L 21/2253 (2013.01); H01L 21/311 (2013.01); H01L 21/823418 (2013.01); H01L 21/823462 (2013.01); H01L 27/088 (2013.01); H01L 29/42316 (2013.01); H01L 29/42368 (2013.01); H01L 29/66659 (2013.01); H01L 29/7835 (2013.01); H01L 29/7836 (2013.01); H01L 29/7856 (2013.01); H01L 29/1045 (2013.01); H01L 29/665 (2013.01); H01L 29/7833 (2013.01);
Abstract

A semiconductor device, includes a first conductive type first doping area, a second conductive type second doping area, a source region, a drain region, a gate insulating film, and a gate electrode. The first conductive type first doping area is formed in a substrate region. The second conductive type second doping area is formed in the substrate to be spaced apart from the first conductive type first doping area. The source region is formed in the first conductive type first doping area. The drain region is formed in the second conductive type second doping area. The gate insulating film is formed between the source region and the drain region. A thickness of a first end of the gate insulating film is different than a thickness of a second end of the gate insulating film. The gate electrode formed on the gate insulating film.


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