The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Feb. 22, 2018
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Yuka Fujito, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0077 (2013.01); G01N 30/72 (2013.01); H01J 49/00 (2013.01); H01J 49/025 (2013.01);
Abstract

A mass spectrometer for performing a selected ion monitoring (SIM) measurement and/or multiple reaction monitoring (MRM) measurement on each of one or a plurality of target components contained in a sample under one or a plurality of measurement conditions is provided. The mass spectrometer includes: a storage sectionin which SIM measurement conditions and/or MRM measurement conditions are previously stored for a plurality of components; a measurement condition selection receiverfor performing the following operations when a command to create a method file in which measurement conditions are described is issued by a user: reading the selected ion monitoring measurement conditions and/or multiple reaction monitoring measurement conditions of the plurality of components, displaying the measurement conditions on a screen, and receiving a selection by the user; and a method file creatorfor creating a method file in which a measurement condition selected by the user is described.


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