The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Jul. 10, 2019
Applicant:

Arm Limited, Cambridge, GB;

Inventor:

Antonio Garcia Guirado, Trondheim, NO;

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01); G06T 15/00 (2011.01); G06F 9/38 (2018.01); G06F 9/30 (2018.01); G06F 12/0802 (2016.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01); G06F 9/30029 (2013.01); G06F 9/3877 (2013.01); G06F 12/0802 (2013.01); G06T 15/005 (2013.01);
Abstract

To determine whether a first n-bit binary data value and a second n-bit binary data value in a data processing system, such as texel position coordinates in a graphics processing system, are the same or differ from each other by exactly one, it is determined whether the first and second data values excluding the least significant bits of the data values are the same as each other, and the least significant bits of the data values are compared. A mask value that is generated for each data value using an XOR operation and a thermometer scanning operation is used to generate an output value for the two data values, based on whether the mask values for a bit position for the first and second data values are both set or not, and a comparison of the bit values of the first and second data values for that bit position.


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