The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

May. 10, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tatsuya Suzuki, Tokyo, JP;

Akihiro Katayama, Tokyo, JP;

Masakazu Fujiki, Kawasaki, JP;

Masahiro Suzuki, Kawasaki, JP;

Toshihiro Kobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/586 (2017.01); G01B 11/25 (2006.01); H04N 5/235 (2006.01); G01B 21/04 (2006.01); H04N 5/225 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/586 (2017.01); G01B 11/25 (2013.01); G01B 11/2513 (2013.01); G01B 21/045 (2013.01); G06T 7/521 (2017.01); G06T 7/97 (2017.01); H04N 5/2256 (2013.01); H04N 5/235 (2013.01); H04N 5/2351 (2013.01);
Abstract

Whether to correct unevenness of brightness of a first image of an object onto which pattern light for three-dimensional shape measurement is projected is determined based on the first image or a second image of the object onto which the pattern light is not projected. If correction is performed, the three-dimensional shape of the object is measured using a corrected image obtained by correcting the unevenness of the brightness of the first image based on the second image; otherwise, the three-dimensional shape of the object is measured using the first image.


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