The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
May. 17, 2019
Faro Technologies, Inc., Lake Mary, FL (US);
Denis Wohlfeld, Ludwigsburg, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A method and system for scanning and measuring an environment is provided. The method includes providing a first three-dimensional (3D) measurement device. The 3D measurement device being operable in a helical mode or a compound mode, wherein a plurality of light beams are emitted along a first path defined by a first axis and a second axis in the compound mode and along a second path defined by the first axis in the helical mode. A mobile platform holding the 3D measurement device is moved from a first position. A first group of 3D coordinates of the area is acquired by the 3D measurement device when the mobile platform is moving. A second group of 3D coordinates of the area is acquired with a second 3D measurement device that with six-degrees of freedom (6DOF). The first group of 3D coordinates is registered based on the third group of 3D coordinates.