The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Mar. 26, 2018
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Makoto Oki, Hino, JP;
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Abstract
An inspection apparatus for inspecting printed matter on which an image is formed, includes: a region extractor that extracts a first region, in which a character is formed, and a second region, in which the character is not formed, with reference to image forming image data used to form the image; and a defect detector that detects a defect in the first region and a defect in the second region in read image data obtained by reading the printed matter on which the image is formed by the image forming image data, wherein the defect detector includes: a first region defect detector that detects loss of a dot in the first region in the read image data; and a second region defect detector that detects presence of a dot with a density equal to or greater than a predetermined density in the second region in the read image data.