The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Apr. 24, 2017
Canon Kabushiki Kaisha, Tokyo, JP;
Shinjiro Hori, Yokohama, JP;
Tetsuya Suwa, Yokohama, JP;
Tomokazu Ishikawa, Yokohama, JP;
Wakako Tanaka, Inagi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An image processing apparatus having a generation unit configured to generate an aligned image by arranging a plurality of candidate images extracted from a reference image around a work inspection image extracted from an inspection target image; a unit configured to subject the aligned image to similar region extraction processing to represent a similarity between regions in the aligned image; a determination unit configured to select a candidate image and determine it as a work reference image based on the aligned image after being subjected to the similar region extraction processing; and a comparison unit to compare the work inspection image with the work reference image. The similar region extraction processing subjects each of a plurality of division regions obtained by dividing the aligned image based on predetermined division size and phase, to averaging processing, and then adds the results of the averaging processing that are obtained by varying at least one of the division size and phase.