The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Aug. 31, 2016
Board of Regents, the University of Texas System, Austin, TX (US);
Alan Bovik, Austin, TX (US);
Todd Goodall, Austin, TX (US);
Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
A method, system and computer program product for measuring non-uniformity noise produced in images or videos (e.g., infrared images or videos). Images or videos, such as infrared images or videos, are captured. A model of scene statistics (statistical model of pictures, images or videos representative of pictures, images or videos, respectively, that are captured of the physical world) is utilized to measure the non-uniformity noise in the captured images or videos by exploiting exhibited characteristics for non-uniformity noise in the captured images or videos. A number signifying a magnitude of non-uniformity for each image or video frame is then generated. In this manner, non-uniformity noise produced in images or videos is measured.