The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Dec. 28, 2015
Applicant:

Apptio, Inc., Bellevue, WA (US);

Inventors:

Eric Yves Theriault, Seattle, WA (US);

Paul Damien McLachlan, Newcastle, WA (US);

Assignee:

Apptio, Inc., Bellevue, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06312 (2013.01); G06Q 10/067 (2013.01);
Abstract

Embodiments are directed towards for managing data models, including resource allocation forecasting. A main data model may be provided. A delta ratio value based on a difference between modified cloned resource values and their corresponding original resource values in the main data model may be provided. Line items from the cloned data model associated with the one or more modified cloned resource values may be provided. Each of the cloned line items may be modified based on the delta ratio value. The modified cloned line items may be stored in the cloned data model. Reports including report information based on the cloned data model may be provided. The report information may indicate changes that were made to one or more other cloned resource values based on the modifications to the one or more cloned resource values.


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