The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Mar. 09, 2018
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Specifying information for specifying a surrounding inspection target which is an inspection target present in a predetermined range with respect to the imaging terminal is acquired from the imaging terminal. The surrounding inspection target is specified among the plurality of inspection targets on the basis of the specifying information. It is evaluated whether or not there is an image acquisition area in which acquisition of a new captured image is necessary for the surrounding inspection target on the basis of a result of accessing a database that stores maintenance and inspection information including at least a captured image for each of the plurality of inspection targets and referring to the maintenance and inspection information of the surrounding inspection target. Image acquisition area information indicating the image acquisition area in which the acquisition of a new captured image is evaluated to be necessary is output to the imaging terminal.