The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

May. 30, 2014
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Haim Shuvali, Yehud, IL;

Amichai Nitsan, Yehud, IL;

Yirat Hendler, Yehud, IL;

Guy Offer, Yehud, IL;

Dana Gilboa, Yehud, IL;

Alon Berkoviz, Yehud, IL;

Assignee:

MICRO FOCUS LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/366 (2013.01); G06F 11/302 (2013.01); G06F 11/3419 (2013.01); G06F 11/3438 (2013.01); G06F 11/3409 (2013.01); G06F 2201/81 (2013.01); G06F 2201/86 (2013.01);
Abstract

Evaluating user experience for an application includes collecting, for each of a plurality of sessions of the application, a list of user event data items experienced during that session. The list of user event data items includes any of a device utilization quantifier, user action-response time pairs, and an application fault indicator. For each session, a value is assigned to each collected user event data item, and a session score is derived based on those assigned values. A user experience score is derived based upon a plurality of the derived session scores. The user experience score is reported.


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