The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Mar. 16, 2018
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Chau Van Ho, DesMoines, WA (US);

Bo Dan, Redmond, WA (US);

Brandon Earl Gary, Redmond, WA (US);

Gary Russell McClary, Palisade, CO (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 1/20 (2006.01); G06F 1/16 (2006.01); G06F 1/28 (2006.01); H04M 1/02 (2006.01); G06F 1/30 (2006.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G06F 1/1616 (2013.01); G06F 1/1618 (2013.01); G06F 1/1647 (2013.01); G06F 1/1649 (2013.01); G06F 1/1677 (2013.01); G06F 1/1694 (2013.01); G06F 1/203 (2013.01); G06F 1/28 (2013.01); H04M 1/0206 (2013.01); H04M 1/0214 (2013.01); G06F 1/1681 (2013.01); G06F 1/30 (2013.01); H04M 2250/12 (2013.01);
Abstract

Cooling of an electronic device that includes a first portion and a second portion is provided. The first portion and the second portion are rotatable relative to each other. A first sensor measures a first temperature at a first location within or on the electronic device continuously or intermittently. A second sensor measures a second temperature at a second location within or on the electronic device continuously or intermittently. A processor identifies a first state of the electronic device or a second state of the electronic device. The processor controls operation of the electronic device based on the first measured temperature and the second measured temperature when the electronic device is in the identified first state and controls the operation of the electronic device based on the first measured temperatures but not based on the second measured temperatures when the electronic device is in the identified second state.


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