The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Dec. 03, 2014
Applicant:

Layerwise N.v., Heverlee, BE;

Inventor:

Peter Mercelis, Heverlee, BE;

Assignee:

LAYERWISE, Heverlee, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); G01B 21/04 (2006.01); G03F 7/00 (2006.01); G03F 7/20 (2006.01); B33Y 50/02 (2015.01); B29C 64/386 (2017.01); G05B 19/4099 (2006.01); B33Y 10/00 (2015.01); B29C 64/135 (2017.01); B29C 64/153 (2017.01); B22F 3/105 (2006.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B29L 9/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); B29C 64/386 (2017.08); B33Y 50/02 (2014.12); G01B 21/042 (2013.01); G03F 7/0037 (2013.01); G03F 7/704 (2013.01); G03F 7/7005 (2013.01); G03F 7/70383 (2013.01); G03F 7/70416 (2013.01); G03F 7/70466 (2013.01); G03F 7/70475 (2013.01); G03F 7/70516 (2013.01); G05B 19/4099 (2013.01); B22F 3/1055 (2013.01); B22F 2003/1056 (2013.01); B29C 64/135 (2017.08); B29C 64/153 (2017.08); B29L 2009/00 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); G05B 2219/49002 (2013.01); Y02P 10/295 (2015.11);
Abstract

The invention concerns a method and a device for calibrating at least one scanning system () when producing an object () by additive manufacturing, wherein the coordinates of one or several reference positions are measured in the relative coordinate system of each scanning system (), after which the calibration of each of the scanning systems is adapted starting from the measured coordinates of the reference positions.


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