The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Dec. 08, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Michiie Sakamoto, Tokyo, JP;
Akinori Hashiguchi, Tokyo, JP;
Shinobu Masuda, Tokyo, JP;
Tsuguhide Sakata, Machida, JP;
Masahide Hasegawa, Yokohama, JP;
Masahiro Ando, Yokohama, JP;
Osamu Nagatsuka, Kawasaki, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A microscope system includes a microscope body, an XY stage mounted on the microscope body and including a stage configured to place a slide as an observation target and move in an X-axis direction and a Y-axis direction perpendicular to each other, and an XY two-dimensional scale plate fixed to the stage. The XY two-dimensional scale plate is provided with a first mark that provides axis information in the X-axis direction throughout a movable range of the stage in the Y-axis direction and a second mark that provides axis information in the Y-axis direction throughout a movable range of the stage in the X-axis direction, which are used to recognize X- and Y-coordinates of the stage.