The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Oct. 11, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Roger Steadman Booker, Aachen, DE;

Ewald Roessl, Ellerau, DE;

Heiner Daerr, Hamburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G01T 1/24 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G01T 1/24 (2013.01); G01T 1/247 (2013.01); A61B 6/4241 (2013.01); A61B 6/585 (2013.01);
Abstract

Photon-counting x-ray detectors () suffer from a degradation of their performance due to polarization. In order to correct the effects of polarization to the generated x-ray images, the invention suggests (i) exposing the radiation detector () to a first radiation pulse emitted by a further radiation source () and obtaining a first electric pulse signal generated by the radiation detector () in response thereto, (ii) later exposing the 5 radiation detector () to a second radiation pulse emitted by the further radiation source () during the acquisition of the image and obtaining a second electric pulse signal generated by the radiation detector () in response thereto, and (iii) comparing amplitudes of the first and second electric pulse signals and generating the x-ray image based on a result of the comparison. The invention provides a corresponding x-ray device and a corresponding method.


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