The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Mar. 07, 2018
Applicant:
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Inventors:
Yoshio Kikuchi, Ninomiya, JP;
Osamu Tsuboi, Kawasaki, JP;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/34 (2006.01); G01F 23/284 (2006.01); G01S 7/40 (2006.01); G01F 23/00 (2006.01); G01S 13/88 (2006.01); G01F 22/00 (2006.01);
U.S. Cl.
CPC ...
G01S 13/34 (2013.01); G01F 23/0076 (2013.01); G01F 23/284 (2013.01); G01S 7/4026 (2013.01); G01S 13/343 (2013.01); G01S 13/88 (2013.01); G01F 22/00 (2013.01);
Abstract
A distance measuring device includes one or more processors configured to: detect a wave formed by synthesizing a frequency-swept electromagnetic wave transmitted to an object with a wave reflected on the object; measure, based on the synthesized wave, a distance to the object; calculate a displacement-caused inclination, caused by the displacement of the object, of a power spectrum of the synthesized wave; and measure the distance based on a signal in which the displacement-caused inclination has been removed from the power spectrum.