The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Aug. 07, 2017
Fluke Corporation, Everett, WA (US);
John Neeley, Seattle, WA (US);
Jordan Schlichting, New Hope, MN (US);
Thomas McManus, Plymouth, MN (US);
Peter Bergstrom, Saint Paul, MN (US);
Lindsey Berdan, Seattle, WA (US);
Joseph V. Ferrante, Redmond, WA (US);
Michael Devin Stuart, Issaquah, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A system for measuring a device under test (DUT) includes a computing device and a measurement device that measures an electrical or physical parameter of the DUT. The computing device receives and stores measurement data in a DUT record associated with the DUT. The computing device further obtains a first image of the DUT, displays the first image as a reference image with a first reference frame, receives a live image of the DUT from an image sensor, and displays the live image with a second reference frame that corresponds to the first reference frame. A cursor on the live image moves according to movement of the image sensor relative to the DUT. A second image of the DUT is obtained, wherein the second image is substantially aligned with the reference image based on an alignment of the cursor with the second reference frame. The second image is stored in the DUT record.