The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Apr. 23, 2018
Applicant:

Fuji Electric Co., Ltd., Kawasaki, JP;

Inventors:

Takahiro Mori, Matsumoto, JP;

Hitoshi Sumida, Matsumoto, JP;

Masahiro Sasaki, Azumino, JP;

Akira Nakamori, Matsumoto, JP;

Masaru Saito, Matsumoto, JP;

Wataru Tomita, Matsumoto, JP;

Osamu Sasaki, Azumino, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G05F 1/59 (2006.01); H03K 17/687 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2621 (2013.01); G05F 1/59 (2013.01); H03K 17/6871 (2013.01); G01R 31/2884 (2013.01);
Abstract

To provide a semiconductor integrated device capable of a gate screening test with no need for any additional circuit and without adding any gate screening terminal. The semiconductor integrated device includes a gate drive unit configured to drive the gate of a voltage controlled semiconductor element and a regulator configured to supply a gate drive voltage to the gate drive unit. The regulator includes an external connection terminal capable of receiving a gate screening voltage for the voltage controlled semiconductor element in a gate screening test.


Find Patent Forward Citations

Loading…