The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Dec. 28, 2016
Art-fi, Orsay, FR;
Lyazid Aberbour, Orsay, FR;
ART-FI, Orsay, FR;
Abstract
In an electromagnetic field measurement system, a probe substrate and a transmission line substrate form a T-shaped structure, where the probe substrate forms a cap and the transmission line substrate forms a stem of the T-shaped structure. The probe substrate includes a probe having a first probe element, a second probe element, and a reference plane. The first probe element and the second probe element are disposed so that there is an axis of symmetry between these probe elements, whereby the axis of symmetry is perpendicular to the transmission line substrate. The transmission line substrate includes a transmission line structure coupled to the probe. The transmission line structure separately guides the first probe signal and the second probe towards a measurement processing arrangement that can provide a measurement results on the basis of the first probe signal and the second probe signal.