The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Aug. 22, 2016
Applicant:

Abb Power Grids Switzerland Ag, Baden, CH;

Inventors:

Xun Gu, Neuenhof, CH;

Sergio Vincenzo Marchese, Zürich, CH;

Klaus Bohnert, Oberrohrdorf, CH;

Andreas Frank, Zürich, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 15/24 (2006.01); G01D 5/26 (2006.01); G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01R 15/241 (2013.01); G01D 5/266 (2013.01); G01D 5/35306 (2013.01);
Abstract

An interferometric sensor and related methods are provided, with a sensing element whereby a measurand induces a relative phase shift between two waves, at least one detector measuring an interference signal between the two waves, and further including a phase shift detection unit having as input the interference signal and determining a first measure representative of the principal value of the relative phase shift, and a contrast detection unit having as input the interference signal for determining a second measure representative of the cross-correlation between the two waves, and a further a processing unit for converting the first and second measures to a measurand value.


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