The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Jun. 28, 2016
Hitachi High-technologies Corporation, Tokyo, JP;
Toshiyuki Inabe, Tokyo, JP;
Akihisa Makino, Tokyo, JP;
Sakuichiro Adachi, Tokyo, JP;
Chie Yabutani, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
The automatic analysis device is provided with (1) a measurement mechanism having a light measuring unit having a reaction container in which the sample is dispensed, a light source which emits light to the reaction container, and a detection unit that detects scattered light from the sample in the reaction container, (2) an amplifier circuit unit having an adder-subtractor that adds or subtracts a correction signal to or from a first measurement signal from the detection unit, and an amplifier circuit which amplifies the output signal by the adder-subtractor at a fixed amplification rate to output a second measurement signal, and (3) an arithmetic operation unit which calculates the correction signal on the basis of a difference between the signal level of the second measurement signal and a target value, and which executes an analysis action based on the second measurement signal after correction by means of the correction signal.