The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Jan. 17, 2018
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Sebastian Standop, Kerpen, DE;
Prashanth Kumar Chinta, Huerth, DE;
Guenter Fuchs, Ruppichteroth, DE;
Stephan Falter, Simmerath, DE;
Assignee:
GE GLOBAL SOURCING LLC, Norwalk, CT (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); B61K 9/10 (2006.01); B61L 15/00 (2006.01); B61L 23/04 (2006.01); G01N 29/06 (2006.01); G01N 29/28 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); B61K 9/10 (2013.01); B61L 15/0072 (2013.01); B61L 23/042 (2013.01); B61L 23/044 (2013.01); G01N 29/0645 (2013.01); G01N 29/28 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2623 (2013.01); G01N 2291/2638 (2013.01);
Abstract
A method and system for inspecting a rail profile include using ultrasonic phased arrays. Determined anomalies, such as material flaws like volumetric defects and cracks, in a fluid-immersed rail profile are detected by employing one or more phased array probes located proximate the rail profile. Electronic delays and beam steering and focusing can be employed to tailor the inspection to the rail geometry.