The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Aug. 31, 2017
Applicant:

Safran, Paris, FR;

Inventors:

Edward Romero, Moissy-Cramayel, FR;

Clement Remacha, Moissy-Cramayel, FR;

Maximilian Melissas, Moissy-Cramayel, FR;

Assignee:

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64F 5/60 (2017.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); B64F 5/60 (2017.01);
Abstract

The method of non-destructive inspection is carried out on an aviation part by a digital imaging system including a source of electromagnetic rays and a detector, and the method includes a prior step of estimating settings for the digital imaging system, which step includes: obtaining a digital model characterizing the digital imaging system and including models characterizing the source and the detector; obtaining a digital model characterizing the aviation part; evaluating a contrast-to-noise ratio for the digital imaging system and the aviation part for a plurality of distinct values of the settings, by making use of the digital models that have been obtained characterizing the digital imaging system and the aviation part; and determining optimum values for the settings that optimize the contrast-to-noise ratio and that are applied to the digital imaging system during a setting up step.


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