The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Mar. 20, 2018
Fanuc Corporation, Yamanashi, JP;
Junichirou Yoshida, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A device capable of easily defining an area other than a surface to be inspected of a workpiece. The device includes a drawing acquisition section for acquiring drawing data of the workpiece; a designation reception section for receiving specification of the surface to be inspected of the workpiece in the drawing data; and a non-inspection area calculation section for calculating, as a non-inspection area, an image area other than the surface to be inspected in an image in a view of the imaging section when the workpiece and the imaging section are positioned at an imaging position at which at least a part of the surface to be inspected as specified falls within the view of the imaging section.