The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2020
Filed:
Oct. 24, 2018
Hitachi-lg Data Storage, Inc., Tokyo, JP;
Daisuke Tomita, Tokyo, JP;
Hideo Suenaga, Tokyo, JP;
Takahiro Kurokawa, Tokyo, JP;
Yoshitaka Morimoto, Tokyo, JP;
HITACHI-LG DATA STORAGE, INC., Tokyo, JP;
Abstract
The optical module for optical height measurement includes a laser light source, an irradiation optical system, a detection optical system, and a detector. The laser light source is configured to irradiate the layer-structured specimen with a light beam. The irradiation optical system includes an objective lens. The objective lens is located to be approximately perpendicular to the layer-structured specimen. The detection optical system is configured to guide a reflected light reflected by the layer-structured specimen and a light passing through the objective lens and an aperture-restrictor-for-return to the detector. The aperture-restrictor-for-return is located immediately after the objective lens. The aperture-restrictor-for-return is configured to restrict the reflected light and cause only a light in a high NA region to pass through. The detector is configured to convert an entered light into a light detection signal. The detector includes a multi-divided detector array.