The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2020

Filed:

Jul. 10, 2018
Applicant:

Sumitomo Electric Industries, Ltd., Osaka-shi, Osaka, JP;

Inventors:

Keisei Morita, Osaka, JP;

Yoshiaki Tamura, Osaka, JP;

Hirotaka Sakuma, Osaka, JP;

Assignee:

SUMITOMO ELECTRIC INDUSTRIES, LTD., Osaka-shi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03C 13/04 (2006.01); C03C 3/06 (2006.01); C03B 37/012 (2006.01);
U.S. Cl.
CPC ...
C03C 13/046 (2013.01); C03B 37/0124 (2013.01); C03B 37/01228 (2013.01); C03B 37/01248 (2013.01); C03C 3/06 (2013.01); C03C 13/045 (2013.01); C03B 2201/12 (2013.01); C03B 2201/20 (2013.01); C03B 2201/50 (2013.01); C03B 2201/54 (2013.01); C03B 2203/29 (2013.01); C03C 2201/11 (2013.01); C03C 2201/12 (2013.01); C03C 2201/50 (2013.01); C03C 2201/54 (2013.01);
Abstract

An optical fiber preform includes a silica-glass core portion, and a cladding portion surrounding the core portion, the cladding portion being composed of a fluorine-containing silica glass having a lower refractive index than the core portion, the core portion including a first region that does not include the central axis thereof, the first region containing a first dopant selected from sodium, potassium, and compounds thereof, and a second region that includes the central axis, the second region containing a second dopant that reduces the viscosity of the silica glass, the second dopant having a diffusion coefficient of 1×10cm/s or more and less than the first dopant at 2,000° C. to 2,300° C., in which the entire core portion has an average first dopant concentration of 10 atomic ppm or more and 2,000 atomic ppm or less and an average second dopant concentration of 10 atomic ppm or more.


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