The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
May. 23, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/32 (2018.01); H04N 13/327 (2018.01); H04N 13/305 (2018.01); H04N 13/317 (2018.01); H04N 13/31 (2018.01); G06T 7/70 (2017.01); H04N 13/125 (2018.01); H04N 13/398 (2018.01); G06T 3/00 (2006.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/327 (2018.05); G06T 3/0093 (2013.01); G06T 7/70 (2017.01); H04N 13/125 (2018.05); H04N 13/305 (2018.05); H04N 13/31 (2018.05); H04N 13/317 (2018.05); H04N 13/398 (2018.05); G06T 2207/30168 (2013.01); H04N 2013/0096 (2013.01);
Abstract
Disclosed is a method and apparatus for calibrating parameters of a three-dimensional (3D) display apparatus, the method including acquiring a first captured image of a 3D display apparatus displaying a first pattern image, adjusting a first parameter set of the 3D display apparatus based on the first captured image, acquiring a second captured image of the 3D display apparatus displaying a second pattern image based on the adjusted first parameter set, and adjusting a second parameter set of the 3D display apparatus based on the second captured image.