The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Jun. 04, 2018
Olympus Corporation, Tokyo, JP;
Yoko Abe, Hino, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A microscopy system includes: an imaging unit configured to capture a subject image generated by an observation optical system of a microscope, and acquire an image; a shifting unit configured to shift positions of a focal plane and a field of view of the observation optical system; an imaging control unit configured to cause the imaging unit to acquire a multi-focused image by shifting the positions of the focal plane and the field of view in one exposure period of the imaging unit; a shift amount acquisition processing unit configured to acquire a shift amount, by which the position of the field of view is shifted; an all-focused image generating unit configured to respectively generate plural all-focused images based on plural multi-focused images and on blurring information; and a display unit configured to consecutively display the generated plural all-focused images.