The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Jan. 10, 2019
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Petri Raisanen, Gilbert, AZ (US);

Michael Eugene Givens, Scottsdale, AZ (US);

Assignee:

ASM IP Holdings, B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); C23C 16/455 (2006.01); H01L 29/49 (2006.01); H01L 21/8238 (2006.01); C23C 16/34 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28088 (2013.01); C23C 16/34 (2013.01); C23C 16/45527 (2013.01); C23C 16/45553 (2013.01); H01L 21/823828 (2013.01); H01L 29/4966 (2013.01); H01L 29/78 (2013.01);
Abstract

Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures are provided. In some embodiments, methods may include contacting a substrate with a first vapor phase reactant comprising a transition metal precursor and contacting the substrate with a second vapor phase reactant comprising an alkyl-hydrazine precursor. In some embodiments, related semiconductor device structures may include a PMOS transistor gate structure, the PMOS transistor gate structure including a transition metal nitride film and a gate dielectric between the transition nitride film and a semiconductor body. The transition metal nitride film includes a predominant (200) crystallographic orientation.


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