The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Apr. 23, 2018
Faro Technologies, Inc., Lake Mary, FL (US);
Reinhard Becker, Stuttgart, DE;
Martin Ossig, Tamm, DE;
Joseph A. Arezone, Cleveland Heights, OH (US);
Gerrit Hillebrand, Waiblingen, DE;
Rene Pfeiffer, Muehlacker, DE;
Daniel Döring, Ditzingen, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A three-dimensional (3D) measurement system and method is provided. The system includes a noncontact measurement device, an annotation member and a processor. The noncontact measurement device being operable to measure a distance from the noncontact measurement device to a surface. The annotation member is coupled to the noncontact measurement device. The processor is operably coupled to the noncontact measurement device and the annotation member, the processor operable to execute computer instructions when executed on the processor for determining 3D coordinates of at least one point in a field of view based at least in part on the distance, recording an annotation in response to an input from a user, and associating the annotation with the at least one point.