The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Mar. 01, 2018
Applicant:
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Inventors:
Nathan D. Shemonski, San Francisco, CA (US);
Mary K. Durbin, San Francisco, CA (US);
Assignee:
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01);
Abstract
An ophthalmic image diagnostic tool and method submits a test image to a neural network trained to identify abnormal regions of an ophthalmic image, to distinguish between multiple types of abnormalities, and to associate an abnormality type with each identified potentially abnormal region. Each potentially abnormal region in the test image is highlighted, and in response to a user-selection of a highlighted region, a previously diagnosed sample (e.g., from a library of samples) of the abnormality type associated with the selected highlighted region is displayed.