The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Nov. 16, 2016
Applicant:
Materialise NV, Leuven, BE;
Inventors:
Tom Craeghs, Leuven, BE;
Sven Cornelissen, Leuven, BE;
Tom Cluckers, Hasselt, BE;
Jan Van Espen, Leuven, BE;
Assignee:
Materialise N.V., Leuven, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/88 (2006.01); B29C 64/386 (2017.01); B33Y 50/02 (2015.01); B23K 26/342 (2014.01); G06T 7/90 (2017.01); B23K 31/12 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B23K 26/342 (2015.10); B23K 31/125 (2013.01); B29C 64/386 (2017.08); B33Y 50/02 (2014.12); G01N 21/8851 (2013.01); G06T 7/90 (2017.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); G06T 2207/10016 (2013.01); G06T 2207/30108 (2013.01);
Abstract
The present disclosure relates to the prediction of part and material quality of Additive Manufacturing (AM) processes using layer based images. Described herein are methods and systems for detection of errors in parts built by AM processes such as Selective Laser Melting (SLM). The detection comprises analysis of optical images to identify errors which appear in layers during the AM build process. Errors include but are not limited to warpage of parts and dross formation of overhang surfaces.