The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Feb. 22, 2017
Applicant:

Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;

Inventors:

Philipp Jester, Heidenheim, DE;

Oliver Schwarz, Rainau, DE;

Michael Totzeck, Schwaebisch Gmuend, DE;

Matthias Barnert, Jena, DE;

Dirk Doering, Erfurt, DE;

Rainer Schmidt, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 7/0002 (2013.01); G06T 7/73 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/30168 (2013.01);
Abstract

The invention relates to an apparatus and a method for determining a defocussing value (Δz, Δz, Δz) for at least one image feature in an image, wherein at least one monochromatic image of an object is generated, wherein the defocussing value (Δz, Δz, Δz) is determined on the basis of the image and depending on the wavelength (λ) of the monochromatic image, and a method and apparatus for image-based determination of a dimensional size.


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