The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2020
Filed:
Feb. 20, 2018
Tata Consultancy Services Limited, Mumbai, IN;
Pankaj Malhotra, Noida, IN;
Vishnu T V, Noida, IN;
Narendhar Gugulothu, Noida, IN;
Lovekesh Vig, Gurgaon, IN;
Puneet Agarwal, Noida, IN;
Gautam Shroff, Gurgaon, IN;
Tata Consultancy Services Limited, Mumbai, IN;
Abstract
This disclosure relates generally to health monitoring of systems, and more particularly to monitor health of a system for fault signature identification. The system estimates Health Index (HI) of the system as time series data. By analyzing data corresponding to the estimated HI, the system identifies one or more time windows in which majority of the estimated HI values are low as a low HI window, and one or more time windows in which majority of the estimated HI values are high as a high HI window. Upon identifying a low HI window, which indicates an abnormal behavior of the system being monitored, based on a local Bayesian Network generated for the system being monitored, an Explainability Index (EI) for each sensor is generated, wherein the EI quantifies contribution of the sensor to the low HI. Further, associated component(s) is identified as contributing to abnormal/faulty behavior of the system.