The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Apr. 01, 2019
Applicant:

Thetaray Ltd, Hod HaSharon, IL;

Inventors:

David Segev, Lapid, IL;

Amir Averbuch, Tel-Aviv, IL;

Assignee:

ThetaRay Ltd., Hod HaSharon, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 5/02 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 16/283 (2019.01); G06N 5/04 (2013.01);
Abstract

A system for detecting an unknown undesirable event comprises an input device configured to receive a dataset comprising a plurality n of multidimensional datapoints (MDDPs), a processor configured to embed the MDDPs in an lower dimension embedded space to obtain embedded MDDPs, and a detection engine configured to calculate distributions of distances D, i=1, . . . , n of each embedded MDDP from a plurality of nearest-neighbors (nn) to compute a threshold Dand to classify a particular MDDP of the dataset or a newly arrived MDDP (NAMDDP) as an abnormal MDDP based on comparison with threshold D, wherein the classification is automatic and unsupervised without relying on a signature, rules or domain expertise and wherein the particular MDDP classified as abnormal is indicative of the unknown undesirable event.


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